Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices

10.1143/JJAP.46.2211

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Bibliographic Details
Main Authors: Wei, X., Shi, L., Chong, T.C., Zhao, R., Lee, H.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83202
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Institution: National University of Singapore