Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices
10.1143/JJAP.46.2211
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Main Authors: | Wei, X., Shi, L., Chong, T.C., Zhao, R., Lee, H.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83202 |
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Institution: | National University of Singapore |
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