Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices
10.1143/JJAP.46.2211
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2014
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sg-nus-scholar.10635-832022024-11-09T09:45:27Z Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices Wei, X. Shi, L. Chong, T.C. Zhao, R. Lee, H.K. ELECTRICAL & COMPUTER ENGINEERING Line-type PCRAM Nano-crystallization Phase change material Thickness-dependent effect 10.1143/JJAP.46.2211 Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 46 4 B 2211-2214 JAPND 2014-10-07T04:38:29Z 2014-10-07T04:38:29Z 2007-04-24 Article Wei, X., Shi, L., Chong, T.C., Zhao, R., Lee, H.K. (2007-04-24). Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 46 (4 B) : 2211-2214. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.46.2211 00214922 http://scholarbank.nus.edu.sg/handle/10635/83202 000247050200081 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| topic |
Line-type PCRAM Nano-crystallization Phase change material Thickness-dependent effect |
| spellingShingle |
Line-type PCRAM Nano-crystallization Phase change material Thickness-dependent effect Wei, X. Shi, L. Chong, T.C. Zhao, R. Lee, H.K. Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices |
| description |
10.1143/JJAP.46.2211 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Wei, X. Shi, L. Chong, T.C. Zhao, R. Lee, H.K. |
| format |
Article |
| author |
Wei, X. Shi, L. Chong, T.C. Zhao, R. Lee, H.K. |
| author_sort |
Wei, X. |
| title |
Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices |
| title_short |
Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices |
| title_full |
Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices |
| title_fullStr |
Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices |
| title_full_unstemmed |
Thickness dependent nano-crystallization in Ge2Sb 2Te5 films and its effect on devices |
| title_sort |
thickness dependent nano-crystallization in ge2sb 2te5 films and its effect on devices |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/83202 |
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1821226047697321984 |