Exposure of defects in GaN by plasma etching

10.1007/s00339-003-2372-5

Saved in:
Bibliographic Details
Main Authors: Choi, H.W., Liu, C., Cheong, M.G., Zhang, J., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55970
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first