Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
10.1063/1.1791321
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sg-nus-scholar.10635-559932023-10-29T23:05:26Z Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique Tay, A.B.H. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1791321 Review of Scientific Instruments 75 10 I 3248-3255 RSINA 2014-06-17T02:49:29Z 2014-06-17T02:49:29Z 2004-10 Article Tay, A.B.H., Thong, J.T.L. (2004-10). Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique. Review of Scientific Instruments 75 (10 I) : 3248-3255. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1791321 00346748 http://scholarbank.nus.edu.sg/handle/10635/55993 000224755800024 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Tay, A.B.H. Thong, J.T.L. |
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Tay, A.B.H. Thong, J.T.L. |
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Tay, A.B.H. Thong, J.T.L. Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
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Tay, A.B.H. |
title |
Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
title_short |
Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
title_full |
Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
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Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
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Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
title_sort |
fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55993 |
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1781781093250236416 |