Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique

10.1063/1.1791321

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Main Authors: Tay, A.B.H., Thong, J.T.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55993
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-559932023-10-29T23:05:26Z Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique Tay, A.B.H. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1791321 Review of Scientific Instruments 75 10 I 3248-3255 RSINA 2014-06-17T02:49:29Z 2014-06-17T02:49:29Z 2004-10 Article Tay, A.B.H., Thong, J.T.L. (2004-10). Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique. Review of Scientific Instruments 75 (10 I) : 3248-3255. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1791321 00346748 http://scholarbank.nus.edu.sg/handle/10635/55993 000224755800024 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1791321
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Tay, A.B.H.
Thong, J.T.L.
format Article
author Tay, A.B.H.
Thong, J.T.L.
spellingShingle Tay, A.B.H.
Thong, J.T.L.
Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
author_sort Tay, A.B.H.
title Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
title_short Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
title_full Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
title_fullStr Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
title_full_unstemmed Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
title_sort fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/55993
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