Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique

10.1063/1.1791321

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Bibliographic Details
Main Authors: Tay, A.B.H., Thong, J.T.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55993
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Institution: National University of Singapore