Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
10.1063/1.1791321
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Main Authors: | Tay, A.B.H., Thong, J.T.L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55993 |
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Institution: | National University of Singapore |
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