Generation-recombination noise in the near fully depleted SIMOX N-MOSFET operating in the linear region

Generation-recombination noise in the near fully depleted SIMOX N-MOSFET operating in the linear region

10.1109/55.962658

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Bibliographic Details
Main Authors: Ang, D.S., Lun, Z., Ling, C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Generation-recombination noise
Lorentzian
Low-frequency noise
SIMOX
SOI
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56126
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Institution: National University of Singapore
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