Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling

10.1109/TED.2003.819371

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書目詳細資料
Main Authors: Ang, D.S., Lun, Z., Ling, C.H.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
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在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/82406
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