Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling

10.1109/TED.2003.819371

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Bibliographic Details
Main Authors:	Ang, D.S., Lun, Z., Ling, C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Generation-recombination (G-R) noise Lorentzian Low-frequency noise Shot-noise Silicon-on-insulator (SOI) SIMOX
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82406
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82406
record_format	dspace
spelling	sg-nus-scholar.10635-824062023-10-30T08:06:49Z Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling Ang, D.S. Lun, Z. Ling, C.H. ELECTRICAL & COMPUTER ENGINEERING Generation-recombination (G-R) noise Lorentzian Low-frequency noise Shot-noise Silicon-on-insulator (SOI) SIMOX 10.1109/TED.2003.819371 IEEE Transactions on Electron Devices 50 12 2490-2498 IETDA 2014-10-07T04:29:01Z 2014-10-07T04:29:01Z 2003-12 Article Ang, D.S., Lun, Z., Ling, C.H. (2003-12). Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling. IEEE Transactions on Electron Devices 50 (12) : 2490-2498. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2003.819371 00189383 http://scholarbank.nus.edu.sg/handle/10635/82406 000188004300022 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Generation-recombination (G-R) noise Lorentzian Low-frequency noise Shot-noise Silicon-on-insulator (SOI) SIMOX
spellingShingle	Generation-recombination (G-R) noise Lorentzian Low-frequency noise Shot-noise Silicon-on-insulator (SOI) SIMOX Ang, D.S. Lun, Z. Ling, C.H. Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling
description	10.1109/TED.2003.819371
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ang, D.S. Lun, Z. Ling, C.H.
format	Article
author	Ang, D.S. Lun, Z. Ling, C.H.
author_sort	Ang, D.S.
title	Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling
title_short	Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling
title_full	Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling
title_fullStr	Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling
title_full_unstemmed	Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling
title_sort	generation-recombination noise in the near fully depleted simox soi n-mosfet - physical characteristics and modeling
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82406
_version_	1781784129554087936

Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling

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