Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling

10.1109/TED.2003.819371

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Bibliographic Details
Main Authors: Ang, D.S., Lun, Z., Ling, C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/82406
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Institution: National University of Singapore

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