Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field

Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field

10.1063/1.3581042

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Bibliographic Details
Main Authors: Jiang, J., Zeng, D.G., Chung, K.-W., Kim, J., Bae, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56172
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/56172

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