Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field
10.1063/1.3581042
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Main Authors: | Jiang, J., Zeng, D.G., Chung, K.-W., Kim, J., Bae, S. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56172 |
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Institution: | National University of Singapore |
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