Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field

10.1063/1.3581042

Saved in:
Bibliographic Details
Main Authors: Jiang, J., Zeng, D.G., Chung, K.-W., Kim, J., Bae, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56172
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first