In situ measurement of wafer temperature using two sensors with different dynamical properties

10.1088/0957-0233/17/11/014

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Bibliographic Details
Main Authors: Tan, W.W., Tang, J.C., Loh, A.P., Tay, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/56297
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Institution: National University of Singapore
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Summary:10.1088/0957-0233/17/11/014