In situ silane passivation of gallium arsenide and deposition of high-permittivity gate dielectric for MOS applications

10.1149/1.2768288

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Bibliographic Details
Main Authors: Zhu, M., Chin, H.-C., Tung, C.-H., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56300
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Institution: National University of Singapore
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