Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method
10.1063/1.1592618
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sg-nus-scholar.10635-563982023-10-29T23:04:08Z Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method Yiang, K.Y. Yoo, W.J. Guo, Q. Krishnamoorthy, A. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1592618 Applied Physics Letters 83 3 524-526 APPLA 2014-06-17T02:54:08Z 2014-06-17T02:54:08Z 2003-07-21 Article Yiang, K.Y., Yoo, W.J., Guo, Q., Krishnamoorthy, A. (2003-07-21). Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method. Applied Physics Letters 83 (3) : 524-526. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1592618 00036951 http://scholarbank.nus.edu.sg/handle/10635/56398 000184186700040 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Yiang, K.Y. Yoo, W.J. Guo, Q. Krishnamoorthy, A. |
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Yiang, K.Y. Yoo, W.J. Guo, Q. Krishnamoorthy, A. |
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Yiang, K.Y. Yoo, W.J. Guo, Q. Krishnamoorthy, A. Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
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Yiang, K.Y. |
title |
Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
title_short |
Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
title_full |
Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
title_fullStr |
Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
title_full_unstemmed |
Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
title_sort |
investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/56398 |
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