Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method

Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method

10.1063/1.1592618

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Bibliographic Details
Main Authors: Yiang, K.Y., Yoo, W.J., Guo, Q., Krishnamoorthy, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56398
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Institution: National University of Singapore
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