Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy

10.1063/1.2159567

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Bibliographic Details
Main Authors:	Chiam, S.Y., Chim, W.K., Huan, A.C.H., Pan, J.S., Zhang, J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56402
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Institution:	National University of Singapore

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Summary:	10.1063/1.2159567

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