Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
10.1063/1.2159567
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Main Authors: | Chiam, S.Y., Chim, W.K., Huan, A.C.H., Pan, J.S., Zhang, J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56402 |
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Institution: | National University of Singapore |
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