Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy

Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy

10.1063/1.2159567

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Bibliographic Details
Main Authors: Chiam, S.Y., Chim, W.K., Huan, A.C.H., Pan, J.S., Zhang, J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56402
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/56402

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