Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy

10.1063/1.2159567

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Bibliographic Details
Main Authors:	Chiam, S.Y., Chim, W.K., Huan, A.C.H., Pan, J.S., Zhang, J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56402
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-56402
record_format	dspace
spelling	sg-nus-scholar.10635-564022023-10-29T23:01:50Z Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy Chiam, S.Y. Chim, W.K. Huan, A.C.H. Pan, J.S. Zhang, J. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2159567 Applied Physics Letters 88 1 - APPLA 2014-06-17T02:54:11Z 2014-06-17T02:54:11Z 2006 Article Chiam, S.Y., Chim, W.K., Huan, A.C.H., Pan, J.S., Zhang, J. (2006). Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy. Applied Physics Letters 88 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2159567 00036951 http://scholarbank.nus.edu.sg/handle/10635/56402 000234428100018 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.2159567
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Chiam, S.Y. Chim, W.K. Huan, A.C.H. Pan, J.S. Zhang, J.
format	Article
author	Chiam, S.Y. Chim, W.K. Huan, A.C.H. Pan, J.S. Zhang, J.
spellingShingle	Chiam, S.Y. Chim, W.K. Huan, A.C.H. Pan, J.S. Zhang, J. Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
author_sort	Chiam, S.Y.
title	Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
title_short	Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
title_full	Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
title_fullStr	Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
title_full_unstemmed	Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
title_sort	investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/56402
_version_	1781781168043065344

Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy

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