Metal carbides for band-edge work function metal gate CMOS devices
10.1109/TED.2008.927946
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sg-nus-scholar.10635-566062023-08-24T07:02:42Z Metal carbides for band-edge work function metal gate CMOS devices Hwang, W.S. Chan, D.S.H. Cho, B.J. ELECTRICAL & COMPUTER ENGINEERING CMOS devices Equivalent oxide thickness (EOT) Flatband voltage HfC high-κ dielectric Metal carbide Metal gate MOS capacitor TaC Work function (WF) 10.1109/TED.2008.927946 IEEE Transactions on Electron Devices 55 9 2469-2474 IETDA 2014-06-17T02:56:30Z 2014-06-17T02:56:30Z 2008 Article Hwang, W.S., Chan, D.S.H., Cho, B.J. (2008). Metal carbides for band-edge work function metal gate CMOS devices. IEEE Transactions on Electron Devices 55 (9) : 2469-2474. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2008.927946 00189383 http://scholarbank.nus.edu.sg/handle/10635/56606 000258914000024 Scopus |
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CMOS devices Equivalent oxide thickness (EOT) Flatband voltage HfC high-κ dielectric Metal carbide Metal gate MOS capacitor TaC Work function (WF) |
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CMOS devices Equivalent oxide thickness (EOT) Flatband voltage HfC high-κ dielectric Metal carbide Metal gate MOS capacitor TaC Work function (WF) Hwang, W.S. Chan, D.S.H. Cho, B.J. Metal carbides for band-edge work function metal gate CMOS devices |
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10.1109/TED.2008.927946 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Hwang, W.S. Chan, D.S.H. Cho, B.J. |
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Article |
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Hwang, W.S. Chan, D.S.H. Cho, B.J. |
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Hwang, W.S. |
title |
Metal carbides for band-edge work function metal gate CMOS devices |
title_short |
Metal carbides for band-edge work function metal gate CMOS devices |
title_full |
Metal carbides for band-edge work function metal gate CMOS devices |
title_fullStr |
Metal carbides for band-edge work function metal gate CMOS devices |
title_full_unstemmed |
Metal carbides for band-edge work function metal gate CMOS devices |
title_sort |
metal carbides for band-edge work function metal gate cmos devices |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/56606 |
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