Microstructures for characterization of seebeck coefficient of doped polysilicon films

10.1007/s00542-010-1183-9

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Bibliographic Details
Main Authors: Xie, J., Lee, C., Wang, M.-F., Tsai, J.M.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56630
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Institution: National University of Singapore