Microstructures for characterization of seebeck coefficient of doped polysilicon films

10.1007/s00542-010-1183-9

Saved in:

Bibliographic Details
Main Authors:	Xie, J., Lee, C., Wang, M.-F., Tsai, J.M.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/56630
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

Be the first to leave a comment!

Similar Items