Microstructures for characterization of seebeck coefficient of doped polysilicon films
10.1007/s00542-010-1183-9
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Main Authors: | Xie, J., Lee, C., Wang, M.-F., Tsai, J.M. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56630 |
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Institution: | National University of Singapore |
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