Microstructures for characterization of seebeck coefficient of doped polysilicon films
10.1007/s00542-010-1183-9
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2014
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sg-nus-scholar.10635-566302023-10-26T10:06:29Z Microstructures for characterization of seebeck coefficient of doped polysilicon films Xie, J. Lee, C. Wang, M.-F. Tsai, J.M. ELECTRICAL & COMPUTER ENGINEERING 10.1007/s00542-010-1183-9 Microsystem Technologies 17 1 77-83 2014-06-17T02:56:47Z 2014-06-17T02:56:47Z 2011-01 Article Xie, J., Lee, C., Wang, M.-F., Tsai, J.M. (2011-01). Microstructures for characterization of seebeck coefficient of doped polysilicon films. Microsystem Technologies 17 (1) : 77-83. ScholarBank@NUS Repository. https://doi.org/10.1007/s00542-010-1183-9 09467076 http://scholarbank.nus.edu.sg/handle/10635/56630 000286203000011 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1007/s00542-010-1183-9 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Xie, J. Lee, C. Wang, M.-F. Tsai, J.M. |
| format |
Article |
| author |
Xie, J. Lee, C. Wang, M.-F. Tsai, J.M. |
| spellingShingle |
Xie, J. Lee, C. Wang, M.-F. Tsai, J.M. Microstructures for characterization of seebeck coefficient of doped polysilicon films |
| author_sort |
Xie, J. |
| title |
Microstructures for characterization of seebeck coefficient of doped polysilicon films |
| title_short |
Microstructures for characterization of seebeck coefficient of doped polysilicon films |
| title_full |
Microstructures for characterization of seebeck coefficient of doped polysilicon films |
| title_fullStr |
Microstructures for characterization of seebeck coefficient of doped polysilicon films |
| title_full_unstemmed |
Microstructures for characterization of seebeck coefficient of doped polysilicon films |
| title_sort |
microstructures for characterization of seebeck coefficient of doped polysilicon films |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/56630 |
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1781781221457526784 |