Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope

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Main Authors:	Wong, W.K., Wei, Y.Z., Phang, J.C.H., Thong, J.T.L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/57464
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-57464
record_format	dspace
spelling	sg-nus-scholar.10635-574642015-05-07T17:29:43Z Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope Wong, W.K. Wei, Y.Z. Phang, J.C.H. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING Scanning 23 2 114-115 SCNND 2014-06-17T03:06:29Z 2014-06-17T03:06:29Z 2001 Article Wong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository. 01610457 http://scholarbank.nus.edu.sg/handle/10635/57464 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Scanning
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Wong, W.K. Wei, Y.Z. Phang, J.C.H. Thong, J.T.L.
format	Article
author	Wong, W.K. Wei, Y.Z. Phang, J.C.H. Thong, J.T.L.
spellingShingle	Wong, W.K. Wei, Y.Z. Phang, J.C.H. Thong, J.T.L. Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
author_sort	Wong, W.K.
title	Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
title_short	Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
title_full	Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
title_fullStr	Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
title_full_unstemmed	Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
title_sort	specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/57464
_version_	1681084869453545472

Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope

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