Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope

• Main Authors: Wong, W.K., Wei, Y.Z., Phang, J.C.H., Thong, J.T.L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/57464
• Institution: National University of Singapore

Scanning