Thin film failure using an interface delamination law

Proceedings of the Electronic Packaging Technology Conference, EPTC

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Bibliographic Details
Main Authors: Liu, P., Cheng, L., Zhang, Y.W.
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/58830
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Institution: National University of Singapore