Thin film failure using an interface delamination law
Proceedings of the Electronic Packaging Technology Conference, EPTC
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Main Authors: | Liu, P., Cheng, L., Zhang, Y.W. |
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Other Authors: | MECHANICAL & PRODUCTION ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/58830 |
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Institution: | National University of Singapore |
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