Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry
10.1016/j.precisioneng.2005.03.001
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sg-nus-scholar.10635-608702023-10-30T10:07:16Z Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry Quan, C. Wang, S.H. Tay, C.J. MECHANICAL ENGINEERING Fast Fourier transform (FFT) Micro-components Non-destructive measurement Optical interferometry Phase-shifting technique Piezoelectric transducer (PZT) 10.1016/j.precisioneng.2005.03.001 Precision Engineering 30 1 23-31 PREGD 2014-06-17T06:28:18Z 2014-06-17T06:28:18Z 2006-01 Article Quan, C., Wang, S.H., Tay, C.J. (2006-01). Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry. Precision Engineering 30 (1) : 23-31. ScholarBank@NUS Repository. https://doi.org/10.1016/j.precisioneng.2005.03.001 01416359 http://scholarbank.nus.edu.sg/handle/10635/60870 000233790700003 Scopus |
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Fast Fourier transform (FFT) Micro-components Non-destructive measurement Optical interferometry Phase-shifting technique Piezoelectric transducer (PZT) |
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Fast Fourier transform (FFT) Micro-components Non-destructive measurement Optical interferometry Phase-shifting technique Piezoelectric transducer (PZT) Quan, C. Wang, S.H. Tay, C.J. Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry |
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10.1016/j.precisioneng.2005.03.001 |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Quan, C. Wang, S.H. Tay, C.J. |
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Article |
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Quan, C. Wang, S.H. Tay, C.J. |
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Quan, C. |
title |
Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry |
title_short |
Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry |
title_full |
Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry |
title_fullStr |
Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry |
title_full_unstemmed |
Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry |
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nanoscale surface deformation inspection using fft and phase-shifting combined interferometry |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/60870 |
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