Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry
10.1016/j.precisioneng.2005.03.001
Saved in:
Main Authors: | Quan, C., Wang, S.H., Tay, C.J. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/60870 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Determination of deflection and Young's modulus of a micro-beam by means of interferometry
by: Wang, S.H., et al.
Published: (2014) -
Application of the holographic carrier fringe and FFT technique for deformation measurement
by: Quan, C., et al.
Published: (2014) -
Development of an optical interferometer for micro-components inspection
by: Wang, S.H., et al.
Published: (2014) -
A genetic optical interferometric inspection on micro-deformation
by: Wang, S.H., et al.
Published: (2014) -
Evaluation of micro-beam deflection using interferometry
by: Wang, S.H., et al.
Published: (2014)