Surface profile measurement in white-light scanning interferometry using a three-chip color CCD
10.1364/AO.50.002246
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sg-nus-scholar.10635-614352023-10-25T23:20:52Z Surface profile measurement in white-light scanning interferometry using a three-chip color CCD Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. MECHANICAL ENGINEERING 10.1364/AO.50.002246 Applied Optics 50 15 2246-2254 APOPA 2014-06-17T06:35:06Z 2014-06-17T06:35:06Z 2011-05-20 Article Ma, S., Quan, C., Zhu, R., Tay, C.J., Chen, L. (2011-05-20). Surface profile measurement in white-light scanning interferometry using a three-chip color CCD. Applied Optics 50 (15) : 2246-2254. ScholarBank@NUS Repository. https://doi.org/10.1364/AO.50.002246 00036935 http://scholarbank.nus.edu.sg/handle/10635/61435 000291094300015 Scopus |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. |
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Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. |
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Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. Surface profile measurement in white-light scanning interferometry using a three-chip color CCD |
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Ma, S. |
title |
Surface profile measurement in white-light scanning interferometry using a three-chip color CCD |
title_short |
Surface profile measurement in white-light scanning interferometry using a three-chip color CCD |
title_full |
Surface profile measurement in white-light scanning interferometry using a three-chip color CCD |
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Surface profile measurement in white-light scanning interferometry using a three-chip color CCD |
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Surface profile measurement in white-light scanning interferometry using a three-chip color CCD |
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surface profile measurement in white-light scanning interferometry using a three-chip color ccd |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/61435 |
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