Surface profile measurement in white-light scanning interferometry using a three-chip color CCD

10.1364/AO.50.002246

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Bibliographic Details
Main Authors:	Ma, S., Quan, C., Zhu, R., Tay, C.J., Chen, L.
Other Authors:	MECHANICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/61435
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Institution:	National University of Singapore

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