Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations

10.1016/j.susc.2007.06.025

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Main Authors: Dai, L., Tan, V.B.C., Yang, S.-W., Wu, P., Chen, X.-T.
Other Authors: MECHANICAL ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/61644
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-616442023-08-29T20:19:55Z Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations Dai, L. Tan, V.B.C. Yang, S.-W. Wu, P. Chen, X.-T. MECHANICAL ENGINEERING NUS NANOSCIENCE & NANOTECH INITIATIVE ab initio Diffusion barrier Interface Low-k Nitrogen Pore-sealing 10.1016/j.susc.2007.06.025 Surface Science 601 16 3366-3371 SUSCA 2014-06-17T06:37:37Z 2014-06-17T06:37:37Z 2007-08-15 Article Dai, L., Tan, V.B.C., Yang, S.-W., Wu, P., Chen, X.-T. (2007-08-15). Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations. Surface Science 601 (16) : 3366-3371. ScholarBank@NUS Repository. https://doi.org/10.1016/j.susc.2007.06.025 00396028 http://scholarbank.nus.edu.sg/handle/10635/61644 000249282600012 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic ab initio
Diffusion barrier
Interface
Low-k
Nitrogen
Pore-sealing
spellingShingle ab initio
Diffusion barrier
Interface
Low-k
Nitrogen
Pore-sealing
Dai, L.
Tan, V.B.C.
Yang, S.-W.
Wu, P.
Chen, X.-T.
Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
description 10.1016/j.susc.2007.06.025
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
Dai, L.
Tan, V.B.C.
Yang, S.-W.
Wu, P.
Chen, X.-T.
format Article
author Dai, L.
Tan, V.B.C.
Yang, S.-W.
Wu, P.
Chen, X.-T.
author_sort Dai, L.
title Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
title_short Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
title_full Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
title_fullStr Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
title_full_unstemmed Understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
title_sort understanding nitrogen-induced effects on the performance of ultra low-k dielectric systems through ab initio simulations
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/61644
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