An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements

Applied Physics Letters

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Main Authors:	Ling, C.H., Cheng, Z.Y.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/61810
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-618102015-01-14T22:34:13Z An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements Ling, C.H. Cheng, Z.Y. ELECTRICAL ENGINEERING Applied Physics Letters 71 22 3218-3220 APPLA 2014-06-17T06:44:14Z 2014-06-17T06:44:14Z 1997-12-01 Article Ling, C.H.,Cheng, Z.Y. (1997-12-01). An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements. Applied Physics Letters 71 (22) : 3218-3220. ScholarBank@NUS Repository. 00036951 http://scholarbank.nus.edu.sg/handle/10635/61810 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Applied Physics Letters
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ling, C.H. Cheng, Z.Y.
format	Article
author	Ling, C.H. Cheng, Z.Y.
spellingShingle	Ling, C.H. Cheng, Z.Y. An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
author_sort	Ling, C.H.
title	An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
title_short	An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
title_full	An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
title_fullStr	An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
title_full_unstemmed	An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
title_sort	improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/61810
_version_	1681085661355966464

An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements

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