Exploratory observations of effect of rapid thermal processing on silicon minority carrier lifetime using laser microwave photoconductance method

Exploratory observations of effect of rapid thermal processing on silicon minority carrier lifetime using laser microwave photoconductance method

Journal of the Electrochemical Society

Saved in:
Bibliographic Details
Main Authors: Choi, W.K., Ah, L.K., Chan, Y.M., Raman, A.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80410
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/80410

Similar Items