Exploratory observations of effect of rapid thermal processing on silicon minority carrier lifetime using laser microwave photoconductance method
Journal of the Electrochemical Society
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Main Authors: | Choi, W.K., Ah, L.K., Chan, Y.M., Raman, A. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80410 |
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Institution: | National University of Singapore |
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