Enhancement of minority-carrier lifetime by an advanced high temperature annealing method

Enhancement of minority-carrier lifetime by an advanced high temperature annealing method

10.1016/j.tsf.2005.09.156

Saved in:
Bibliographic Details
Main Authors: Pan, H., Tong, L., Feng, Y., Lin, J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Subjects:
Advanced annealing
Defect-free zone
Lifetime of minority-carrier
Oxygen precipitates
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98699
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/98699

Similar Items