Enhancement of minority-carrier lifetime by an advanced high temperature annealing method

Enhancement of minority-carrier lifetime by an advanced high temperature annealing method

10.1016/j.tsf.2005.09.156

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Bibliographic Details
Main Authors: Pan, H., Tong, L., Feng, Y., Lin, J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Subjects:
Advanced annealing
Defect-free zone
Lifetime of minority-carrier
Oxygen precipitates
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98699
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Institution: National University of Singapore
Description
Summary:10.1016/j.tsf.2005.09.156

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