Enhancement of minority-carrier lifetime by an advanced high temperature annealing method

• Main Authors: Pan, H., Tong, L., Feng, Y., Lin, J.
• Other Authors: PHYSICS
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Advanced annealing; Defect-free zone; Lifetime of minority-carrier; Oxygen precipitates
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/98699
• Institution: National University of Singapore

10.1016/j.tsf.2005.09.156