An improved drain-current-conductance method with substrate back-biasing

10.1109/16.740913

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Bibliographic Details
Main Authors:	Tan, C.B., Chim, W.K., Chan, D.S.H., Lou, C.L.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Subjects:	Body effect Channel mobility MOSFET Parameter extraction Series resistance
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/61811
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Institution:	National University of Singapore

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Summary:	10.1109/16.740913

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