An improved drain-current-conductance method with substrate back-biasing
10.1109/16.740913
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sg-nus-scholar.10635-618112023-08-28T22:12:13Z An improved drain-current-conductance method with substrate back-biasing Tan, C.B. Chim, W.K. Chan, D.S.H. Lou, C.L. ELECTRICAL ENGINEERING Body effect Channel mobility MOSFET Parameter extraction Series resistance 10.1109/16.740913 IEEE Transactions on Electron Devices 46 2 431-433 IETDA 2014-06-17T06:44:15Z 2014-06-17T06:44:15Z 1999 Article Tan, C.B., Chim, W.K., Chan, D.S.H., Lou, C.L. (1999). An improved drain-current-conductance method with substrate back-biasing. IEEE Transactions on Electron Devices 46 (2) : 431-433. ScholarBank@NUS Repository. https://doi.org/10.1109/16.740913 00189383 http://scholarbank.nus.edu.sg/handle/10635/61811 000078226700024 Scopus |
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Body effect Channel mobility MOSFET Parameter extraction Series resistance Tan, C.B. Chim, W.K. Chan, D.S.H. Lou, C.L. An improved drain-current-conductance method with substrate back-biasing |
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10.1109/16.740913 |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Tan, C.B. Chim, W.K. Chan, D.S.H. Lou, C.L. |
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Tan, C.B. Chim, W.K. Chan, D.S.H. Lou, C.L. |
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Tan, C.B. |
title |
An improved drain-current-conductance method with substrate back-biasing |
title_short |
An improved drain-current-conductance method with substrate back-biasing |
title_full |
An improved drain-current-conductance method with substrate back-biasing |
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An improved drain-current-conductance method with substrate back-biasing |
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An improved drain-current-conductance method with substrate back-biasing |
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improved drain-current-conductance method with substrate back-biasing |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/61811 |
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