Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing

Applied Physics Letters

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Bibliographic Details
Main Authors: Lim, P.S., Chim, W.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61847
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Institution: National University of Singapore
Description
Summary:Applied Physics Letters