Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing
Applied Physics Letters
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sg-nus-scholar.10635-618472015-01-09T06:39:15Z Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing Lim, P.S. Chim, W.K. ELECTRICAL ENGINEERING Applied Physics Letters 77 17 2719-2721 APPLA 2014-06-17T06:44:40Z 2014-06-17T06:44:40Z 2000-10-23 Article Lim, P.S.,Chim, W.K. (2000-10-23). Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing. Applied Physics Letters 77 (17) : 2719-2721. ScholarBank@NUS Repository. 00036951 http://scholarbank.nus.edu.sg/handle/10635/61847 NOT_IN_WOS Scopus |
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Applied Physics Letters |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Lim, P.S. Chim, W.K. |
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Article |
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Lim, P.S. Chim, W.K. |
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Lim, P.S. Chim, W.K. Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
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Lim, P.S. |
title |
Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
title_short |
Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
title_full |
Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
title_fullStr |
Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
title_full_unstemmed |
Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
title_sort |
anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/61847 |
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