Contact resistivity measurement using four circular contacts
10.1016/0038-1101(92)90168-C
Saved in:
Main Authors: | Chua, S.J., Lee, S.H. |
---|---|
Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/61967 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
The effects of current spreading in the semiconductor on the determination of contact resistance
by: Chua, S.J., et al.
Published: (2014) -
The effects of current spreading in the semiconductor on the determination of contact resistance
by: Chua, S.J., et al.
Published: (2014) -
Low-contact-resistance graphene devices with nickel-etched-graphene contacts
by: Leong, W.S., et al.
Published: (2014) -
Contact pressure measurement
by: THET NAING TUN
Published: (2010) -
CONTACT PRESSURE MEASUREMENT
by: NG SUM HUAN
Published: (2019)