Electromigration resistance in a short three-contact interconnect tree

10.1063/1.2196114

Saved in:
Bibliographic Details
Main Authors: Chang, C.W., Choi, Z.-S., Thompson, C.V., Gan, C.L., Pey, K.L., Choi, W.K., Hwang, N.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55850
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore