Electromigration resistance in a short three-contact interconnect tree
10.1063/1.2196114
Saved in:
| Main Authors: | , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55850 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-55850 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-558502023-10-25T21:22:19Z Electromigration resistance in a short three-contact interconnect tree Chang, C.W. Choi, Z.-S. Thompson, C.V. Gan, C.L. Pey, K.L. Choi, W.K. Hwang, N. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2196114 Journal of Applied Physics 99 9 - JAPIA 2014-06-17T02:47:49Z 2014-06-17T02:47:49Z 2006-05-01 Article Chang, C.W., Choi, Z.-S., Thompson, C.V., Gan, C.L., Pey, K.L., Choi, W.K., Hwang, N. (2006-05-01). Electromigration resistance in a short three-contact interconnect tree. Journal of Applied Physics 99 (9) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2196114 00218979 http://scholarbank.nus.edu.sg/handle/10635/55850 000237682900084 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1063/1.2196114 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Chang, C.W. Choi, Z.-S. Thompson, C.V. Gan, C.L. Pey, K.L. Choi, W.K. Hwang, N. |
| format |
Article |
| author |
Chang, C.W. Choi, Z.-S. Thompson, C.V. Gan, C.L. Pey, K.L. Choi, W.K. Hwang, N. |
| spellingShingle |
Chang, C.W. Choi, Z.-S. Thompson, C.V. Gan, C.L. Pey, K.L. Choi, W.K. Hwang, N. Electromigration resistance in a short three-contact interconnect tree |
| author_sort |
Chang, C.W. |
| title |
Electromigration resistance in a short three-contact interconnect tree |
| title_short |
Electromigration resistance in a short three-contact interconnect tree |
| title_full |
Electromigration resistance in a short three-contact interconnect tree |
| title_fullStr |
Electromigration resistance in a short three-contact interconnect tree |
| title_full_unstemmed |
Electromigration resistance in a short three-contact interconnect tree |
| title_sort |
electromigration resistance in a short three-contact interconnect tree |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/55850 |
| _version_ |
1781412199293517824 |