Error probability of M-ary DPSK in fast Rician fading and lognormal shadowing
Electronics Letters
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Main Authors: | Tan, S.H., Tjhung, T.T. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62151 |
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Institution: | National University of Singapore |
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